Identification of deep trap levels from thermally stimulated current spectra of semi-insulating CdZnTe detector material
نویسندگان
چکیده
منابع مشابه
Characterization of Deep Levels in n-type and Semi-Insulating 4H-SiC Epitaxial Layers by Thermally Stimulated Current Spectroscopy
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2008
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.2959354